Measurement of Radioactivity - Alpha- Beta- and Photon Emitting Radionuclides - Reference Measurement Standard Specifications for the Calibration of Surface Contamination Monitors (Second Revision)
Document Title [Hindi] :
रेडियोधर्मिता का मापन - अल्फा-, बीटा- और फोटॉन उत्सर्जक रेडियोन्यूक्लाइड - सतह संदूषण मॉनिटरों के अंशांकन के लिए संदर्भ मापन मानक विनिर्देश
Document Type :
Revision
Language :
English
Priority :
2
ICS Code :
17.240
Date of Project Approval :
09-07-2025
Standards to be Revised :
Sl.No.
Is No & Year
1
IS 16693 : 2018
Standards to be Superseded :
Sl.No.
Is No & Year
1
IS 16693 : 2018
Classification Details
Group :
Chemicals, Plastics and their Products including packaging and Environment
Sub Group :
Chemicals
Sub Sub Group :
Radioactive Residue Test Methods
Aspects :
Methods of tests
Risk :
Low
Certification :
Not Certifiable
Short Commom Man's Title :
ITCHS Code :
Ministry :
Department of Atomic Energy
Sustainable development Goals :
Degree of Equivalence :
Identical under dual numbering
Identical/Equivalent Standards :
ISO 8769 : 2020
Organization Type:
ISO
Division Council Chairperson Approval Details
Sl.No.
Synosis Points
1
This document specifies the specifications for reference measurement standards used to calibrate surface contamination monitors that detect alpha-, beta-, and photon-emitting radionuclides. It ensures accuracy and consistency in measuring radioactive surface contamination. This document relates to alpha-emitters, beta-emitters, and photon emitters of maximum photon energy not greater than 1.5 MeV.
2
The following changes in the revision are as follows:
3
a) In order to maintain consistency with terms described in the International Vocabulary of Metrology or ISO/IEC 17025, “reference measurement standard”, “working measurement standard” and “transfer measurement device” were adopted respectively instead of a “reference source”, “working source” and “reference transfer instrument”.
4
b) 5.1 b): “a surface layer of thickness equal to the saturation layer thickness” was modified to “a surface layer of thickness equal to or less than the saturation layer thickness”.
5
c) 5.2.3 and 5.3.3: The statement of “minus its relative standard uncertainty” was removed.
6
d) 5.4.3: Requirement for the re-measurement of uniformity was added as follows; “In case that significant change not due to half-life is found on the re-calibration of surface emission rate, re measurement of uniformity is required.”