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Basic Details/ मूल ब्यौरा
Comment
IS Number/
आईएस संख्या
:
IS 13554:2020
IEC 60294 : 2012
IS Title/
आईएस शीर्षक
:
Measurement of the Dimensions of a Cylindrical Component with Axial Terminations ( First Revision )
Superseding IS/
सुपरसीडिंग आईएस
:
None
Degree of Equivalence/
समतुल्यता स्तर
:
Identical under dual numbering
Number of Revisions/
पुनरीक्षणों की संख्या
:
1
Number of Amendments/
संशोधनों की संख्या
:
No amendment issued
Aspect/
पक्ष
:
Methods of tests
Language/
भाषा
:
English
Reaffirmation Year/
पुनर्पुष्टि वर्ष
:
Technical Department/
तकनीकी विभाग
:
LITD (Electronics and Information Technology Department)
Technical Committee/
तकनीकी समिति
:
LITD 05 (Semiconductor And Other Electronic Components And Devices Sectional Committee)
Member Secretary/
सदस्य सचिव
:
Pritam Sarkar
Other Details
Indian Standard
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Amendment : 0
Gazette Document : 1
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License : 0
Product Manual & SIT : 0
Laboratory : 0
Classification Details
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Cross Reference Details
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Composition
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Corrigendum : 0
Cross Reference Details
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Indian Standards Referred In IS IS 13554:2020
IEC 60294 : 2012
:
Standard contains no Cross Referenced Indian Standard.
International Standards Referred In IS 13554:2020
IEC 60294 : 2012
1
IEC 60301 : 0 : 0 0
IS 13554:2020
IEC 60294 : 2012
is Referred in following Indian Standards :
1
IS 14642 : Part 2 : 1999
Compressed air for general use: Part 2 test methods for aerosol oil content
CHD 06
2
IS 7305 : 2018
Fixed capacitors for use in electronic equipment - Generic specification (Second Revision)
LITD 05
3
IS 13247 : Part 1 : 1992
Complete filter units for radio interference suppression: Part 1 generic specification
LITD 05
4
IS 9205 : Part 1 : 1979
Specification for directly heated negat4e temperature coefficient thermistors: Part 1 general requirements and methods of tests
LITD 24
5
IS 17777 : 2021
Textiles Dyed knitted or crochet fabric made from synthetic fibres Specification
TXD 10
6
IS 17893 : 2023
Work Permit System - Code of Practice
CHD 07
Classification Details
Group
:
Electronic and Telecom equipments, components and devices
Sub Group
:
Electronic components and devices
Sub Sub Group
:
Semiconductor devices - Integrated circuits
Aspect
:
Methods of tests
Certification
:
