Home
About the Activity
Standard of the Week
Standard of the Month
BIS Talks
Know Your Standard
Contact Us
Login
Know your standards
Home
Know your standards
All the standards published after 01 Oct 2025 are available in new portal. Please click here to view the portal
Search Indian Standard (IS) :
By IS Number
By Keyword
IS On ECO Mark
Search multiple keywords:
Please enter multiple keywords or keyword strings separated by comma(,) and press enter to see multiple keyword search results
Basic Details/ मूल ब्यौरा
IS Number/
आईएस संख्या
:
IS 10076 (Part 1):1981
IS Title/
आईएस शीर्षक
:
Specification for linearity control units used with TV picture tubes: Part 1 general requirements and tests (Withdrawn)
Superseded by IS/
प्रतिस्थापित आईएस
:
Decided by council
Degree of Equivalence/
समतुल्यता स्तर
:
Indigenous
Number of Revisions/
पुनरीक्षणों की संख्या
:
New Standard
Number of Amendments/
संशोधनों की संख्या
:
No amendment issued
Aspect/
पक्ष
:
Methods of tests
Language/
भाषा
:
English
Reaffirmation Year/
पुनर्पुष्टि वर्ष
:
Technical Department/
तकनीकी विभाग
:
LITD (Electronics and Information Technology Department)
Technical Committee/
तकनीकी समिति
:
LITD 24 (Electro-Mechanical and Electromagnetic Components and Mechanical structures Sectional Committee Sectional Committee)
Member Secretary/
सदस्य सचिव
:
Mr. AVINASH KUMAR (SCIENTIST-B)
Other Details
Gazette Document : 1
Click to download
Classification details for: IS 10076 : Part 1 : 1981
Click to view
Cross Reference Details
Click to view
Cross Reference Details
Download
Indian Standards Referred In IS IS 10076 (Part 1):1981
:
1
IS 9000 (Part 1):1988
Basic environmental testing procedures for electronic and electrical items: Part 1 general (First Revision)
LITD 01
2
IS 9000 (Part 1):1988
Basic environmental testing procedures for electronic and electrical items: Part 1 general (First Revision)
LITD 01
3
IS 2612:1965
Recommendation for type approval and sampling procedures for electronic components
LITD 03
4
IS 9000 (Part 8):1981
Basic environmental testing procedures for electronic and electrical items: Part 8 vibration (Sinusoidal) test
LITD 01
5
IS 9000 (Part 19/Sec 15):1986
Basic environmental testing procedures for electronic and electrical items: Part 19 test u: robustness of terminations and integral mounting devices (First Revision)
LITD 05
6
IS 9000 (Part 18/Sec 13):1981
Basic environmental testing procedures for electronic and electrical items: Part 18 solderABility test
LITD 05
7
IS 9000 (Part 7/Sec 15):1979
Basic environmental testing procedures for electronic and electrical items: Part 7 impact test
LITD 01
8
IS 9000 (Part 2/Sec 14):1977
Basic environmental testing procdures for electronic and electrical items: Part 2 cold test
LITD 01
9
IS 9000 (Part 3/Sec 15):1977
Basic environmental testing procedures for electronic and electrical items: Part 3 dry heat test
LITD 01
10
IS 9000 (Part 5/Sec 12):1981
Basic environmental testing procedures for electronic and electrical items: Part 5 damp heat (Cyclic) test
LITD 01
11
IS 9000 (Part 13):1981
Basic environmental testing procedures for electronic and electrical items: Part 13 low air pressure test
LITD 01
12
IS/ISO 9000-4:1993
Quality Management and Quality Assurance Standards - Part 4 : Guide to Dependability Programme Management
MSD 02
13
IS 9000 (Part 10):1979
Basic environmental testing procedures for electronic and electrical items: Part 10 mould growth test
LITD 01
14
IS 589:1961
Basic climatic and mechanical durability tests for components for electronic and electrical equipment
LITD 02
15
IS 9000 (Part 14/Sec 13):1988
Basic environmental testing procedures for electronic and electrical items:Part 14 test n:change of temperature (First Revision)
LITD 01
International Standards Referred In IS 10076 (Part 1):1981
Standard contains no Cross Referenced International Standard.
IS 10076 (Part 1):1981
is Referred in following Indian Standards :
Standard contains no Cross Referenced Indian Standard.
Classification Details
Group
:
Electronic and Telecom equipments, components and devices
Sub Group
:
Electronic components and devices
Sub Sub Group
:
Electronic components
Aspect
:
Methods of tests
Certification
: