Sampling procedures for inspection by attributes: Part 1 sampling schemes indexed by acceptance quality limit (AQL) for lot - By - Lot inspection (Third Revision)
Sampling inspection procedures: Part 3 attribute sampling plans indexed by limiting quality (LQ) for isolated lot inspection iso title sampling procedures for inspection by attributes: Part 2 sampling pians indexed by limiting quality (LQ) for isolated lot inspection
Sampling procedures for inspection by variables: Part 3 double sampling schemes indexed by acceptance quality limit (AQL) for lot - By - Lot inspection
MSD 3
International Standards Referred In IS/ISO 28598-1:2017 ISO 28598-1:2017
Standard contains no Cross Referenced International Standard.
IS/ISO 28598-1:2017 ISO 28598-1:2017 is Referred in following Indian Standards :
Standard contains no Cross Referenced Indian Standard.
Classification Details
Group
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Electronic and Telecom equipments, components and devices