| IS Number : | IS 11425 : 1985 IEC 60333: 1983 Reviewed In : 2020 |
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| IS Title [Eng-Hn] : | Test procedures for semiconductor charged - Particle detectors |
| No of Revision : | 0 |
| No of Amendments : | 0 |
| Technical Department : | Electronics and Information Technology Department |
| Technical Committee : | LITD 8 ( Electronic Measuring Instruments, Systems And Accessories ) |
| Language : | English |
| Group : | Electronic and Telecom equipments, components and devices |
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| Sub Group: | Electronic equipments and systems |
| Sub Sub Group : | Electronic measuring instruments & weighing systems |
| Aspects: | Methods of tests |
| Certification: | None |
| Ministry : | |
| Short Commom Man's Title: | Test procedures for semiconductor charged particle detectors |
| Itchs: | N/A |
| Degree of Equivalence: | Identical under dual numbering |
| Identical/Equivalent Standards: | IEC 60333: 1983 |
| Organisation : |
| Indian Standards Refered In IS IS 11425 : 1985 : |
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| International Standards Refered In IS 11425 : 1985 | Standard contains no Cross Referenced International Standard. | ||||||||||||
| IS 11425 : 1985 is Refered in following Indian Standards : |
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