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Basic Details
IS Number : IS/IEC 60603-8 : 1990
60603-8: 1990
IS Title [Eng-Hn] : Connectors for frequencies below 3 MHz for use with printed boards Part 8: Two-part connectors for printed boards for basic grid of 2.54 mm (0.1 in), with square male contacts of 0.63 mm x 0.63 mm
No of Revision : 0
No of Amendments : 0
Technical Department : Electronics and Information Technology Department
Technical Committee : LITD 3 ( Electromechanical Components And Mechanical Structures For Electronic--equipment )
Language : English

Classification Details
Group : Electronic and Telecom equipments, components and devices
Sub Group: Electronic components and devices
Sub Sub Group : Electromechanical components
Aspects: Product Specification
Certification:
Ministry : Ministry of Housing and Urban Affairs
Short Commom Man's Title:
Itchs: N/A
Degree of Equivalence: Identical under single numbering
Identical/Equivalent Standards:60603-8: 1990
Organisation :

Cross Referencing Details
Indian Standards Refered In IS IS/IEC 60603 : Part 8 : 1990 :
SNo IS Number Title Technical Committee
1
IS 1885 : Part 6 : 1978 Electrotechnical vocabulary: Part 6 printed circuits (First Revision) LITD 5
2
IS 10424 : 1982 Guide for design and use of printed boards LITD 5
3
IS 12448 : Part 1 : 1988 Basic testing procedures and measuring methods for electromechanical components for electronic equipment: Part 1 general LITD 3
4
IS 12448 : Part 2 : Sec 1 : 1988 Basic testing procedures and measuring methods for electrotechnical components for electronic equipment: Part 2 general examination, electrical continuity and contact resistance tests, insulation tests and voltage stress tests: Sec 1 general examination LITD 3
5
IS 12448 : Part 2 : Sec 2 : 1988 Basic testing procedures and measuring methods for electromechanical components for electronic equipment: Part 2 general examination, electrical continuity and contact resistance tests, insulation tests and voltage stress tests: Sec 2 electrical continuity and contact resistance tests LITD 3
6
IS 12448 : Part 2 : Sec 3 : 1988 Basic testing procedures and measuring methods for electromechanical components for electronic equipment: Part 2 general examination, electrical continuity and contact resistance tests, insulation tests and voltage stress tests: Sec 3 insulation tests LITD 3
7
IS 12448 : Part 2 : Sec 4 : 1988 Basic testing procedures and measuring methods for electromechanical components for electronic equipment: Part 2 general examination, electrical continuity and contact resistance tests, insulation tests and voltage stress tests: Sec 4 voltage stress tests LITD 3
8
IS 12448 : Part 3 : 1989 Basic testing procedures and measuring methods for electromechanical components for electronic equipment: Part 3 current - Carrying capacity tests LITD 3
9
IS 12448 : Part 4 : 1989 Basic testing procedures and measuring methods for Electromechanical components for electronic equipment: Part 4 dynamic stress tests LITD 3
10
IS 12448 : Part 5 : Sec 1 : 1989 Basic testing procedures and measuring methods for electromechanical components for electronic equipment: Part 5 impact tests (Free Components), static load tests (Fixed Components), endurance tests and overload tests: Sec 1 impact tests (Free Components) LITD 3
11
IS 12448 : Part 5 : Sec 2 : 1989 Basic testing procedure and measuring methods for electromechanical components: Part 5 (Fixed For Electronic Equipment Impact Tests (Free Components), static load tests components), endurance tests and overload tests .: Sec 2 static load tests (Fixed Components) LITD 3
12
IS 12448 : Part 5 : Sec 3 : 1989 Basic testing measuring standard procedures and methods for electromechanical components for electronic equipment: Part 5 impact tests (Free Components), static load tests (Fixed Components), endurance tests and overload tests: Sec 3 endurance tests LITD 3
13
IS 12448 : Part 5 : Sec 4 : 1989 Basic testing procedures and measuring methods for electromechanical components for electronic equipment: Part 5 impact tests (Free Components), static load tests (Fixed Components), endurance tests and overload tests: Sec 4 overload tests LITD 3
14
IS 12448 : Part 6 : 1991 Basic testing procedures and measuring methods for electromechanical components for electronic equipment: Part 6 climatic tests and soldering tests LITD 3
15
IS 12448 : Part 7 : 1990 Basic testing procedures and measuring methods for electromechanical components for electronic equipment: Part 7 mechanical operating tests and sealing tests LITD 3
16
IS 12448 : Part 8 : 1992 Basic testing procedures and measuring methods for electromechanical components for electronic equipment: Part 8 connector tests (Mechanical) and mechanical tests on contacts and terminations LITD 3
17
IS 12448 : Part 9 : 1992 Basic testing procedures and measuring methods for electromechanical components for electronic equipment:Part 9 Cable-clamping tests, explosion hazard tests,chemical resistance tests,fire hazard tests of LITD 3
18
IS 8945 : 1987 Specification for electrical measuring instruments for explosive gas atmospheres (First Revision) ETD 22
International Standards Refered In IS/IEC 60603 : Part 8 : 1990 Standard contains no Cross Referenced International Standard.
IS/IEC 60603 : Part 8 : 1990 is Refered in following Indian Standards :
SNo IS Number Title Technical Committee
1 IS/IEC 60603 : Part 8 : 1990 Connectors for frequencies below 3 MHz for use with printed boards Part 8: Two-part connectors for printed boards for basic grid of 2.54 mm (0.1 in), with square male contacts of 0.63 mm x 0.63 mm LITD 3