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Indian Standard Details

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Basic Details
IS Number : IS/IEC 61076-4-100) : 2001
61076-4-100 : 2001
IS Title [Eng-Hn] : Connectors for electronic equipment Part 4-100: Printed board connectors with assessed quality Detail specification for two-part connector modules having a grid of 2.5 mm for printed boards and backplanes
No of Revision : 0
No of Amendments : 0
Technical Department : Electronics and Information Technology Department
Technical Committee : LITD 3 ( Electromechanical Components And Mechanical Structures For Electronic--equipment )
Language : English

Classification Details
Group : Electronic and Telecom equipments, components and devices
Sub Group: Electronic components and devices
Sub Sub Group : Electromechanical components
Aspects: Product Specification
Certification:
Ministry : Ministry of Power
Short Commom Man's Title:
Itchs: N/A
Degree of Equivalence: Identical under single numbering
Identical/Equivalent Standards:61076-4-100 : 2001
Organisation :

Cross Referencing Details
Indian Standards Refered In IS IS/IEC 61076 : Part 4 : Sec 100 : 2001 :
SNo IS Number Title Technical Committee
1
IS 9000 : Part 1 : 1988 Basic environmental testing procedures for electronic and electrical items: Part 1 general (First Revision) LITD 1
2
IS 10424 : 1982 Guide for design and use of printed boards LITD 5
3
IS 10673 : 1983 Sampling plans and procedures for inspection by attributes for electronic items LITD 2
4
IS 11719 : Part 2 : Sec 1 : 1986 Dimensions of mechanical structures of the 482.6 mm series: Part 2 subracks and associated plug - In - Units: Sec 1 subracks LITD 3
5
IS 11719 : Part 2 : Sec 2 : 1986 Dimensions of mechanical structures of the 482.6 mm series: Part 2 subracks and associated plug - In units: Sec 2 plug - In units LITD 3
6
IS 12448 : Part 1 : 1988 Basic testing procedures and measuring methods for electromechanical components for electronic equipment: Part 1 general LITD 3
7
IS 12448 : Part 2 : Sec 1 : 1988 Basic testing procedures and measuring methods for electrotechnical components for electronic equipment: Part 2 general examination, electrical continuity and contact resistance tests, insulation tests and voltage stress tests: Sec 1 general examination LITD 3
8
IS 12448 : Part 2 : Sec 2 : 1988 Basic testing procedures and measuring methods for electromechanical components for electronic equipment: Part 2 general examination, electrical continuity and contact resistance tests, insulation tests and voltage stress tests: Sec 2 electrical continuity and contact resistance tests LITD 3
9
IS 12448 : Part 2 : Sec 3 : 1988 Basic testing procedures and measuring methods for electromechanical components for electronic equipment: Part 2 general examination, electrical continuity and contact resistance tests, insulation tests and voltage stress tests: Sec 3 insulation tests LITD 3
10
IS 12448 : Part 2 : Sec 4 : 1988 Basic testing procedures and measuring methods for electromechanical components for electronic equipment: Part 2 general examination, electrical continuity and contact resistance tests, insulation tests and voltage stress tests: Sec 4 voltage stress tests LITD 3
11
IS 12448 : Part 3 : 1989 Basic testing procedures and measuring methods for electromechanical components for electronic equipment: Part 3 current - Carrying capacity tests LITD 3
12
IS 12448 : Part 4 : 1989 Basic testing procedures and measuring methods for Electromechanical components for electronic equipment: Part 4 dynamic stress tests LITD 3
13
IS 12448 : Part 5 : Sec 1 : 1989 Basic testing procedures and measuring methods for electromechanical components for electronic equipment: Part 5 impact tests (Free Components), static load tests (Fixed Components), endurance tests and overload tests: Sec 1 impact tests (Free Components) LITD 3
14
IS 12448 : Part 5 : Sec 2 : 1989 Basic testing procedure and measuring methods for electromechanical components: Part 5 (Fixed For Electronic Equipment Impact Tests (Free Components), static load tests components), endurance tests and overload tests .: Sec 2 static load tests (Fixed Components) LITD 3
15
IS 12448 : Part 5 : Sec 3 : 1989 Basic testing measuring standard procedures and methods for electromechanical components for electronic equipment: Part 5 impact tests (Free Components), static load tests (Fixed Components), endurance tests and overload tests: Sec 3 endurance tests LITD 3
16
IS 12448 : Part 5 : Sec 4 : 1989 Basic testing procedures and measuring methods for electromechanical components for electronic equipment: Part 5 impact tests (Free Components), static load tests (Fixed Components), endurance tests and overload tests: Sec 4 overload tests LITD 3
17
IS 12448 : Part 6 : 1991 Basic testing procedures and measuring methods for electromechanical components for electronic equipment: Part 6 climatic tests and soldering tests LITD 3
18
IS 12448 : Part 7 : 1990 Basic testing procedures and measuring methods for electromechanical components for electronic equipment: Part 7 mechanical operating tests and sealing tests LITD 3
19
IS 12448 : Part 8 : 1992 Basic testing procedures and measuring methods for electromechanical components for electronic equipment: Part 8 connector tests (Mechanical) and mechanical tests on contacts and terminations LITD 3
20
IS 12448 : Part 9 : 1992 Basic testing procedures and measuring methods for electromechanical components for electronic equipment:Part 9 Cable-clamping tests, explosion hazard tests,chemical resistance tests,fire hazard tests of LITD 3
International Standards Refered In IS/IEC 61076 : Part 4 : Sec 100 : 2001 Standard contains no Cross Referenced International Standard.
IS/IEC 61076 : Part 4 : Sec 100 : 2001 is Refered in following Indian Standards :
SNo IS Number Title Technical Committee
1 IS/IEC 60947 : Part 5 : Sec 2 : 2007 Low - Voltage switchgear and controlgear: Part 5 control circuit devices and switching elements: Sec 2 proximity switches ETD 7