| IS Number : | IS 12641:2004 IEC 60749: 2002 |
|---|---|
| IS Title [Eng-Hn] : | Semiconductor devices - Mechanical and climatic test methods (First Revision) |
| No of Revision : | 1 |
| No of Amendments : | 0 |
| Technical Department : | Electronics and Information Technology Department |
| Technical Committee : | LITD 5 ( Semiconductor And Other Electronic Components And Devices ) |
| Language : | English |
| Group : | Electronic and Telecom equipments, components and devices |
|---|---|
| Sub Group: | Electronic components and devices |
| Sub Sub Group : | Electronic components |
| Aspects: | Methods of tests |
| Certification: | None |
| Ministry : | |
| Short Commom Man's Title: | Semiconductor Devices - Mechanical and Climatic Test Methods |
| Itchs: | N/A |
| Degree of Equivalence: | Identical under dual numbering |
| Identical/Equivalent Standards: | IEC 60749: 2002 |
| Organisation : |
| Indian Standards Refered In IS IS 12641 : 2004 : |
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| International Standards Refered In IS 12641 : 2004 | Standard contains no Cross Referenced International Standard. | ||||||||||||||||
| IS 12641 : 2004 is Refered in following Indian Standards : |
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