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Indian Standard Details

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Basic Details
IS Number : IS 12737 : 1988
IEC 60759
Reviewed In : 2023
IS Title [Eng-Hn] : Standard test procedures for semiconductor X - Ray energy spectrometers
No of Revision : 0
No of Amendments : 0
Technical Department : Electronics and Information Technology Department
Technical Committee : LITD 8 ( Electronic Measuring Instruments, Systems And Accessories )
Language : English

Classification Details
Group : Electronic and Telecom equipments, components and devices
Sub Group: Electronic equipments and systems
Sub Sub Group : Electronic measuring instruments & weighing systems
Aspects: Methods of tests
Certification: None
Ministry :
Short Commom Man's Title: Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers
Itchs: N/A
Degree of Equivalence: Identical under dual numbering
Identical/Equivalent Standards:IEC 60759
Organisation :

Cross Referencing Details
Indian Standards Refered In IS IS 12737 : 1988 :
SNo IS Number Title Technical Committee
1
IS 1885 : Part 63 : 1985 Electrotechnical vocabulary: Part 63 nuclear instrumentation LITD 8
2
IS 11425 : 1985 Test procedures for semiconductor charged - Particle detectors LITD 8
3
IS 11645 : 1985 Test procedures for amplifiers and preamplifiers for semiconductor detectors for ionizing radiation LITD 8
4
IS 12639 : 1988 Test Procedures for Germanium Detectors For X and Gamma Radiation MED 32
International Standards Refered In IS 12737 : 1988 Standard contains no Cross Referenced International Standard.
IS 12737 : 1988 is Refered in following Indian Standards : Standard contains no Cross Referenced Indian Standard.