| IS Number : | IS 12737:1988 IEC 60759 |
|---|---|
| IS Title [Eng-Hn] : | Standard test procedures for semiconductor X - Ray energy spectrometers |
| No of Revision : | 0 |
| No of Amendments : | 0 |
| Technical Department : | Electronics and Information Technology Department |
| Technical Committee : | LITD 8 ( Electronic Measuring Instruments, Systems And Accessories ) |
| Language : | English |
| Group : | Electronic and Telecom equipments, components and devices |
|---|---|
| Sub Group: | Electronic equipments and systems |
| Sub Sub Group : | Electronic measuring instruments & weighing systems |
| Aspects: | Methods of tests |
| Certification: | None |
| Ministry : | |
| Short Commom Man's Title: | Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers |
| Itchs: | N/A |
| Degree of Equivalence: | Identical under dual numbering |
| Identical/Equivalent Standards: | IEC 60759 |
| Organisation : |
| Indian Standards Refered In IS IS 12737 : 1988 : |
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| International Standards Refered In IS 12737 : 1988 | Standard contains no Cross Referenced International Standard. | ||||||||||||||||||||
| IS 12737 : 1988 is Refered in following Indian Standards : | Standard contains no Cross Referenced Indian Standard. |