| IS Number : | IS 15444 (Part 1) : 2012 IEC 61163-1: 2006 Reviewed In : 2022 |
|---|---|
| IS Title [Eng-Hn] : | Reliability stress screening: Part 1 repairable assemblies Manufactured in lots (First Revision) |
| No of Revision : | 1 |
| No of Amendments : | 0 |
| Technical Department : | Electronics and Information Technology Department |
| Technical Committee : | LITD 2 ( Dependability of Electronic, Electrical Components, Equipment and Systems ) |
| Language : | English |
| Group : | Electronic and Telecom equipments, components and devices |
|---|---|
| Sub Group: | Electronic components and devices |
| Sub Sub Group : | Reliability of Electronic and Electrical items |
| Aspects: | Methods of tests |
| Certification: | None |
| Ministry : | |
| Short Commom Man's Title: | Reliability Stress Screening - Part 1 : Repairable Assemblies Manufactured in Lots |
| Itchs: | N/A |
| Degree of Equivalence: | Identical under dual numbering |
| Identical/Equivalent Standards: | IEC 61163-1: 2006 |
| Organisation : |
| Indian Standards Refered In IS IS 15444 : Part 1 : 2012 : |
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| International Standards Refered In IS 15444 : Part 1 : 2012 | Standard contains no Cross Referenced International Standard. | ||||||||
| IS 15444 : Part 1 : 2012 is Refered in following Indian Standards : | Standard contains no Cross Referenced Indian Standard. |