Indian_standards - BIS Connect

IS Number/आईएस संख्या : IS 11425:1985
IEC 60333: 1983

IS Title/आईएस शीर्षक : Test procedures for semiconductor charged - Particle detectors (Withdrawn)

Superseded by IS/प्रतिस्थापित आईएस : decided by council

Degree of Equivalence/समतुल्यता स्तर : Identical under dual numbering

Number of Revisions/पुनरीक्षणों की संख्या : New Standard

Number of Amendments/संशोधनों की संख्या : No amendment issued

Aspect/पक्ष : Methods of tests

Language/भाषा : English

Reaffirmation Year/पुनर्पुष्टि वर्ष :

Technical Department/तकनीकी विभाग : LITD (Electronics and Information Technology Department)

Technical Committee/तकनीकी समिति : LITD 08 (Electronic Measuring Instruments, Systems And Accessories Sectional Committee)

Member Secretary/सदस्य सचिव : Pritam Sarkar

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Indian Standards Referred In IS IS 11425:1985
IEC 60333: 1983
:

1	IS 1885 (Part 63):1985 IEC 60050-391(1975)	Electrotechnical vocabulary: Part 63 nuclear instrumentation	LITD 08

International Standards Referred In IS 11425:1985
IEC 60333: 1983

Standard contains no Cross Referenced International Standard.

IS 11425:1985
IEC 60333: 1983
is Referred in following Indian Standards :

1	IS 11798 : 1985	Definitions of test method terms for semiconductor radiation detectors and scintillation counting	LITD 08
2	IS 12737 : 1988	Standard test procedures for semiconductor X - Ray energy spectrometers	LITD 08

Certification	:
Group	:	Electronic and Telecom equipments, components and devices
Sub Group	:	Electronic equipments and systems
Sub Sub Group	:	Electronic measuring instruments & weighing systems
Aspect	:	Methods of tests

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