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IS Number/आईएस संख्या : IS 11798:1985
IEC 60596

IS Title/आईएस शीर्षक : Definitions of test method terms for semiconductor radiation detectors and scintillation counting (Withdrawn)

Superseded by IS/प्रतिस्थापित आईएस : decided by council

Degree of Equivalence/समतुल्यता स्तर : Identical under dual numbering

Number of Revisions/पुनरीक्षणों की संख्या : New Standard

Number of Amendments/संशोधनों की संख्या : No amendment issued

Aspect/पक्ष : Terminology

Language/भाषा : English

Reaffirmation Year/पुनर्पुष्टि वर्ष :

Technical Department/तकनीकी विभाग : LITD (Electronics and Information Technology Department)

Technical Committee/तकनीकी समिति : LITD 08 (Electronic Measuring Instruments, Systems And Accessories Sectional Committee)

Member Secretary/सदस्य सचिव : Pritam Sarkar

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Indian Standards Referred In IS IS 11798:1985
IEC 60596
:

1	IS 1885 (Part 63):1985 IEC 60050-391(1975)	Electrotechnical vocabulary: Part 63 nuclear instrumentation	LITD 08
2	IS 11425:1985 IEC 60333: 1983	Test procedures for semiconductor charged - Particle detectors	LITD 08

International Standards Referred In IS 11798:1985
IEC 60596

1	IEC 60430 : 0 : 0 0
2	IEC 60462 : 0 : 0 0

IS 11798:1985
IEC 60596
is Referred in following Indian Standards :

Standard contains no Cross Referenced Indian Standard.

Certification	:
Group	:	Electronic and Telecom equipments, components and devices
Sub Group	:	Electronic equipments and systems
Sub Sub Group	:	Electronic measuring instruments & weighing systems
Aspect	:	Terminology

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