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Basic Details/ मूल ब्यौरा
Comment
IS Number/
आईएस संख्या
:
IS 15038:2011
IEC 61164: 2004
IS Title/
आईएस शीर्षक
:
Reliability growth - Statistical test and estimation methods (First Revision)
Superseding IS/
सुपरसीडिंग आईएस
:
None
Degree of Equivalence/
समतुल्यता स्तर
:
Identical under dual numbering
Number of Revisions/
पुनरीक्षणों की संख्या
:
1
Number of Amendments/
संशोधनों की संख्या
:
No amendment issued
Aspect/
पक्ष
:
Methods of tests
Language/
भाषा
:
English
Reaffirmation Year/
पुनर्पुष्टि वर्ष
:
Technical Department/
तकनीकी विभाग
:
LITD (Electronics and Information Technology Department)
Technical Committee/
तकनीकी समिति
:
LITD 02 (Dependability of Electronic, Electrical Components, Equipment and Systems Sectional Committee)
Member Secretary/
सदस्य सचिव
:
Priyanshu Sharma
Other Details
Indian Standard
Click to download
Amendment : 0
Gazette Document : 0
License : 0
Product Manual & SIT : 0
Laboratory : 0
Classification Details
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Cross Reference Details
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Composition
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Corrigendum : 0
Cross Reference Details
Download
Indian Standards Referred In IS IS 15038:2011
IEC 61164: 2004
:
1
IS 8161 (Part 4):2018
NULL
Equipment reliability testing: Part 4 statistical procedures for exponential distribution - Point estimates, confidence intervals, prediction intervals and tolerance intervals (First Revision)
LITD 02
2
IS 8161 (Part 6/Sec 1):1983
Guide for equipment reliABility testing: Part 6 tests for validity of a constant failure rate assumption: Sec 1 chi - Square test
LITD 02
International Standards Referred In IS 15038:2011
IEC 61164: 2004
1
IEC 60300 : 3 : 5 2001
2
IEC 60605 : 4 : 0 0
3
IEC 61014 : 2003
4
IEC 60605 : 4 : 0 0
5
IEC 60605 : 4 : 0 0
6
IEC 60605 : 4 : 0 0
7
IEC 60605 : 6 : 0 0
IS 15038:2011
IEC 61164: 2004
is Referred in following Indian Standards :
1
IS 15474 : Part 3 : Sec 5 : 2018
Dependability Management Part 3 Application Guide Section 5 Reliability Test Conditions and Statistical Test Principles
LITD 02
Classification Details
Group
:
Electronic and Telecom equipments, components and devices
Sub Group
:
Electronic components and devices
Sub Sub Group
:
Reliability and Dependability of Electronic Components
Aspect
:
Methods of tests
Certification
:
