Basic testing procedures and measuring methods for electrotechnical components for electronic equipment: Part 2 general examination, electrical continuity and contact resistance tests, insulation tests and voltage stress tests: Sec 1 general examination
Safety of machinery - Pressure - Sensitive protective devices: Part 3 general principles for design and testing of pressure - Sensitive bumpers, plates, wires and similar devices
Electromagnetic compatibility (EMC): Part 4 testing and measurement techniques: Sec 4 electrical fast transient / burst immunity test (Second Revision)
Electromagnetic compatibility EMC: Part 4 testing and measurement techniques: Sec 11 voltage dips short interruptions and voltage variations immunity tests for equipment with input current up to 16 A per phase
Limits and Methods of Measurement of Radio Disturbance Characteristics Part 4 Industrial Scientific and Medical Radio-Frequency Equipment Second Revision
LITD 09
International Standards Referred In IS/IEC 62271-1:2017 IEC 62271-1:2017+AMD1:2021 CSV
1
IEC 61810 : 7 : 2006
2
IEC 60050 : 192 : 2015
3
IEC 60050 : 581 : 2008
4
IEC 60050 : 601 : 0 0
5
IEC 60050 : 605 : 0 0
6
IEC 60050 : 614 : 2016
7
IEC 60050 : 811 : 0 0
8
IEC 60050 : 826 : 2004
9
IEC 60068 : 2 : 2 2007
10
IEC 60068 : 2 : 30 2005
11
IEC 60296 : 0 : 0 0
12
IEC 61000 : 4 : 18
13
IEC 61000 : 4 : 26
14
IEC 61000 : 6 : 5
15
IEC 62271 : 4 : 0 0
16
IEC 18 : 2 : 0 0
IS/IEC 62271-1:2017 IEC 62271-1:2017+AMD1:2021 CSV is Referred in following Indian Standards :
Connectors for electronic equipment Part 4-100: Printed board connectors with assessed quality Detail specification for two-part connector modules having a grid of 2.5 mm for printed boards and backplanes